2021年最新SCI期刊影响因子查询系统
MICROELECTRONICS RELIABILITY 期刊详细信息
基本信息
期刊名称 | MICROELECTRONICS RELIABILITY MICROELECTRONICS RELIABILITY |
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期刊ISSN | 0026-2714 |
期刊官方网站 | http://www.journals.elsevier.com/microelectronics-reliability/ |
是否OA | 否 |
出版商 | Elsevier Ltd |
出版周期 | Monthly |
始发年份 | 1964 |
年文章数 | 526 |
最新影响因子 | 1.418(2021) |
中科院SCI期刊分区
大类学科 | 小类学科 | Top | 综述 |
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工程技术4区 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气4区 | 否 | 否 |
NANOSCIENCE & NANOTECHNOLOGY 纳米科技4区 | |||
PHYSICS, APPLIED 物理:应用4区 |
CiteScore
CiteScore排名 | CiteScore | SJR | SNIP | ||
---|---|---|---|---|---|
学科 | 排名 | 百分位 | 1.70 | 0.376 | 0.983 |
Materials Science Surfaces, Coatings and Films |
48 / 116 | 59% |
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Engineering Safety, Risk, Reliability and Quality |
54 / 154 | 64% |
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Physics and Astronomy Atomic and Molecular Physics, and Optics |
76 / 173 | 56% |
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Materials Science Electronic, Optical and Magnetic Materials |
95 / 225 | 57% |
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Physics and Astronomy Condensed Matter Physics |
168 / 397 | 57% |
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Engineering Electrical and Electronic Engineering |
248 / 661 | 62% |
补充信息
自引率 | 19.70% |
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H-index | 80 |
SCI收录状况 |
Science Citation Index
Science Citation Index Expanded |
官方审稿时间 | |
网友分享审稿时间 | 数据统计中,敬请期待。 |
PubMed Central (PML) | http://www.ncbi.nlm.nih.gov/nlmcatalog?term=0026-2714%5BISSN%5D |
投稿指南
期刊投稿网址 | http://ees.elsevier.com/mr/ |
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收稿范围 | Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field. Additional regular features will include: • Special issues devoted to significant international conferences, or to important developing topics • Letters to the Editors • Industrial news and updates • Calendar of forthcoming events • Book reviews Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application. |
收录体裁 | Original research papers, introductory invited and reviews papers, and research notes. |
投稿指南 | https://www.elsevier.com/journals/microelectronics-reliability/0026-2714/guide-for-authors |
投稿模板 | |
参考文献格式 | https://www.elsevier.com/journals/microelectronics-reliability/0026-2714/guide-for-authors |
编辑信息 |